Dr. John M. Carpenter
at Argonne National Lab
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 30 December 2003 Paper
Walter Gibson, Arthur Schultz, James Richardson, John Carpenter, David Mildner, Heather Chen-Mayer, M. Miller, E. Maxey, Henry Prask, Thomas Gnaeupel-Herold, Russell Youngman
Proceedings Volume 5199, (2003) https://doi.org/10.1117/12.510736
KEYWORDS: Diffraction, Crystals, Sensors, Crystallography, Single crystal X-ray diffraction, Laser crystals, Proteins, Channel projecting optics, Integrated optics, Optical testing

Proceedings Article | 18 November 2002 Paper
Michael Agamalian, John Carpenter, K. Littrell, Pappannan Thiyagarajan, Christine Rehm
Proceedings Volume 4785, (2002) https://doi.org/10.1117/12.469979
KEYWORDS: Crystals, Scattering, Cameras, Diffraction, Silicon, Laser crystals, Polymers, Spatial resolution, Signal to noise ratio, Time of flight cameras

Proceedings Article | 18 November 2002 Paper
Geza Zsigmond, John Carpenter, Ferenc Mezei
Proceedings Volume 4785, (2002) https://doi.org/10.1117/12.452282
KEYWORDS: Crystals, Sensors, Monte Carlo methods, Statistical analysis, Spectroscopy, Scattering, Signal detection, Commercial off the shelf technology, Device simulation, Backscatter

Proceedings Article | 2 February 1993 Paper
Peter Egelstaff, John Carpenter
Proceedings Volume 1737, (1993) https://doi.org/10.1117/12.138674
KEYWORDS: Gamma radiation, Particles, Crystals, Physics, Scattering, X-rays, Light scattering, Sensors, Information operations, Radiography

Proceedings Article | 2 February 1993 Paper
Pappannan Thiyagarajan, K. Bradley, Roy Crawford, J. Epperson, Denis Wozniak, John Carpenter
Proceedings Volume 1737, (1993) https://doi.org/10.1117/12.138664
KEYWORDS: Sensors, Spatial resolution, Computer programming, Floods, Scattering, Gamma radiation, Laser scattering, Electronics, Polymers, Scatter measurement

Proceedings Volume Editor (1)

Conference Committee Involvement (1)
Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
20 July 1992 | San Diego, CA, United States
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