Dr. John M. Carpenter
at Argonne National Lab
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 30 December 2003 Paper
Proc. SPIE. 5199, Penetrating Radiation Systems and Applications V
KEYWORDS: Diffraction, Proteins, Sensors, Crystals, Optical testing, Integrated optics, Laser crystals, Crystallography, Channel projecting optics, Single crystal X-ray diffraction

Proceedings Article | 18 November 2002 Paper
Proc. SPIE. 4785, Advances in Neutron Scattering Instrumentation
KEYWORDS: Statistical analysis, Backscatter, Scattering, Sensors, Spectroscopy, Crystals, Monte Carlo methods, Signal detection, Commercial off the shelf technology, Device simulation

Proceedings Article | 18 November 2002 Paper
Proc. SPIE. 4785, Advances in Neutron Scattering Instrumentation
KEYWORDS: Signal to noise ratio, Diffraction, Scattering, Cameras, Polymers, Crystals, Silicon, Time of flight cameras, Laser crystals, Spatial resolution

Proceedings Article | 2 February 1993 Paper
Proc. SPIE. 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
KEYWORDS: Scattering, Sensors, Particles, Crystals, X-rays, Light scattering, Radiography, Physics, Gamma radiation, Information operations

Proceedings Article | 2 February 1993 Paper
Proc. SPIE. 1737, Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
KEYWORDS: Electronics, Scattering, Sensors, Polymers, Laser scattering, Computer programming, Gamma radiation, Spatial resolution, Scatter measurement, Floods

Proceedings Volume Editor (1)

Conference Committee Involvement (1)
Neutrons, X Rays, and Gamma Rays: Imaging Detectors, Material Characterization Techniques, and Applications
20 July 1992 | San Diego, CA, United States
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