Mr. John Todd Downing Profile

John Todd Downing

at Micron Technology Inc

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Publications (1)

Proceedings Article | 16 July 2002 Paper

Simplified cusum model for automated control of fab processes

John Downing, Tracey Sorenson

Proceedings Volume 4689, (2002) https://doi.org/10.1117/12.473522

KEYWORDS: Data modeling, Process control, Critical dimension metrology, Mathematics, Error control coding, Metrology, Manufacturing, Process modeling, Mathematical modeling, Data centers

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