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John M. Green
Co-Owner and Founder at Xiomas Technologies
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Publications (1)
Proceedings Article | 20 April 1998 Paper
Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy
Proceedings Volume 3244, (1998) https://doi.org/10.1117/12.307008
KEYWORDS: Optical coatings, Multilayers, Atomic force microscopy, Laser induced damage, Thermography, Optics manufacturing, Laser damage threshold, Hafnium, Silica, Electron beams
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