Mr. John Kam Profile

John Kam

at Microsoft

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Publications (2)

Proceedings Article | 3 September 2019 Presentation + Paper

Robust and objective automatic optical surface inspection using modulated dark field phasing illumination

Heejoo Choi, John Kam, Joel Berkson, Logan Graves, Huang Lei, Dae Wook Kim

Proceedings Volume 11102, 1110207 (2019) https://doi.org/10.1117/12.2529869

KEYWORDS: Particles, Inspection, Image processing, Modulation, Optical inspection, Data processing

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SPIE Journal Paper | 26 March 2019

Modulated dark-field phasing detection for automatic optical inspection

Heejoo Choi, John Mineo Kam, Joel David Berkson, Logan Rodriguez Graves, Dae Wook Kim

OE, Vol. 58, Issue 09, 092603, (March 2019) https://doi.org/10.1117/12.10.1117/1.OE.58.9.092603

KEYWORDS: Particles, Modulation, Optical inspection, Sensors, Light emitting diodes, Signal to noise ratio, Inspection, Light sources, Optical engineering, Data processing

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