Prof. John W. V. Miller Profile

Prof. John W. V. Miller

Associate Professor at Univ of Michigan

SPIE Involvement:

Author

Publications (41)

Proceedings Article | 17 November 2005 Paper

Networked vision system using a prolog controller

B. Batchelor, S. Caton, L. Chatburn, R. Crowther, J. W. Miller

Proceedings Volume 5999, 59990G (2005) https://doi.org/10.1117/12.631705

KEYWORDS: Image processing, MATLAB, Java, Control systems, Computer programming, Cameras, Databases, Machine vision, Intelligence systems, Computing systems

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Proceedings Article | 7 November 2005 Paper

Fast software implementations of common 3x3 operators

Frederick Waltz, John Miller

Proceedings Volume 6000, 600005 (2005) https://doi.org/10.1117/12.634979

KEYWORDS: Sensors, Bandpass filters, Linear filtering, Machine vision, Detection and tracking algorithms, Clocks, Convolution, Image processing, Nonlinear filtering, Inspection

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Proceedings Article | 7 November 2005 Paper

Fast grey-level co-occurrence matrix calculations for texture analysis

Frederick Waltz, John Miller

Proceedings Volume 6000, 600004 (2005) https://doi.org/10.1117/12.634764

KEYWORDS: Matrices, Computing systems, Inspection, Raster graphics, Clocks, Spatial frequencies, Machine vision, Image quality, Electrochemical etching, Fractal analysis

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Proceedings Article | 7 November 2005 Paper

Vision systems on the internet

B. Batchelor, S. Caton, L. Chatburn, R. Crowther, J. Miller

Proceedings Volume 6000, 600003 (2005) https://doi.org/10.1117/12.631704

KEYWORDS: Cameras, Inspection, Image processing, Internet, Machine vision, Prototyping, Imaging systems, MATLAB, Control systems, Light sources and illumination

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Proceedings Article | 16 December 2004 Paper

Background removal for check processing using morphology

Yimei Ding, Fumitaka Kimura, Minoru Okada, Malayappan Shridhar, John Miller

Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.580573

KEYWORDS: Image processing, Distortion, Feature extraction, Image registration, Image analysis, Digital imaging, Control systems, Remote sensing, Data processing, Printing

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Proceedings Article | 16 December 2004 Paper

Camera sensitivity study

Jonathan Schlueter, Yi Murphey, John Miller, Malayappan Shridhar, Yun Luo, Farid Khairallah

Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.580522

KEYWORDS: Cameras, Imaging systems, Classification systems, Neural networks, Image analysis, Control systems, Optical filters, Data acquisition, Lutetium, Collision avoidance

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Proceedings Article | 16 December 2004 Paper

Slant correction for handwritten English documents

Malayappan Shridhar, Fumitaka Kimura, Yimei Ding, John Miller

Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.580524

KEYWORDS: Iterative methods, Image processing, Binary data, Image compression, Optical character recognition, Control systems, Image segmentation, Computer engineering, Standards development, 3D vision

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Proceedings Article | 26 February 2004 Paper

Camera performance considerations for automotive applications

John Miller, Yi Lu Murphey, Farid Khairallah

Proceedings Volume 5265, (2004) https://doi.org/10.1117/12.519406

KEYWORDS: Sensors, Cameras, Photons, CMOS sensors, Imaging systems, Quantum efficiency, Image quality, Light sources and illumination, Headlamps, Charge-coupled devices

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Proceedings Article | 26 February 2004 Paper

Fast image processing using finite-state machines: software implementations

Frederick Waltz, John Miller

Proceedings Volume 5265, (2004) https://doi.org/10.1117/12.519407

KEYWORDS: Binary data, Image processing, Computing systems, Convolution, Digital filtering, Image filtering, Gaussian filters, Clocks, Sensors, Control systems

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Proceedings Article | 11 February 2002 Paper

Grassfire transform using finite-state machines

Frederick Waltz, John Miller

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455248

KEYWORDS: Selenium, Binary data, Distance measurement, Computing systems, Image processing, Diamond, Combustion, Logic, Mathematics, Inspection

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Proceedings Article | 11 February 2002 Paper

Grayscale template-matching using finite-state machines

Frederick Waltz, John Miller

Proceedings Volume 4567, (2002) https://doi.org/10.1117/12.455247

KEYWORDS: Computing systems, Tolerancing, Image processing, Binary data, Image quality, Logic, Mathematics, Electrochemical etching, Image analysis, Optical inspection

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Proceedings Article | 12 February 2001 Paper

License plate recognition using SKIPSM

Malayappan Shridhar, Frederick Waltz, John Miller, G. Houle, L. Bijnagte, Ryan Dibble

Proceedings Volume 4189, (2001) https://doi.org/10.1117/12.417184

KEYWORDS: Image filtering, Image segmentation, Image processing, Detection and tracking algorithms, Linear filtering, Optical character recognition, Image resolution, Binary data, Image acquisition, Cameras

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Proceedings Article | 12 February 2001 Paper

Software SKIPSM implementation for template matching

Frederick Waltz, John Miller

Proceedings Volume 4189, (2001) https://doi.org/10.1117/12.417210

KEYWORDS: Binary data, Image processing, Computing systems, Image analysis, Image quality, Optical inspection, Inspection, Operating systems, Electrochemical etching, Convolution

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SPIE Journal Paper | 1 January 2001

Gray-scale image processing algorithms using finite-state machine concepts

Frederick Waltz, John Miller

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1329334

KEYWORDS: Image processing, Binary data, Gaussian filters, Convolution, Linear filtering, Image filtering, Computer programming, Bandpass filters, Nonlinear filtering, Spatial frequencies

SPIE Journal Paper | 1 January 2001 Open Access

Special Section on Machine Vision for Industrial Inspection

Kenneth Tobin, John Miller

JEI, Vol. 10, Issue 01, (January 2001) https://doi.org/10.1117/12.10.1117/1.1337356

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