John R. Taylor
Physicist
SPIE Involvement:
Author
Publications (22)

Proceedings Article | 7 February 2006 Paper
Proceedings Volume 5991, 59912A (2006) https://doi.org/10.1117/12.637825
KEYWORDS: Coating, Laser induced damage, Antireflective coatings, National Ignition Facility, Optical testing, Yield improvement, Silica, Laser optics, Mirrors, Laser development

Proceedings Article | 30 May 2003 Paper
Robert Chow, Michael Thomas, Robert Bickel, John Taylor
Proceedings Volume 4932, (2003) https://doi.org/10.1117/12.480213
KEYWORDS: Magnetorheological finishing, Laser damage threshold, Surface roughness, Surface finishing, Lenses, Laser induced damage, Antireflective coatings, National Ignition Facility, Aspheric lenses, Polishing

Proceedings Article | 27 December 2002 Paper
Proceedings Volume 4889, (2002) https://doi.org/10.1117/12.467918
KEYWORDS: Imaging systems, Extreme ultraviolet, Photomasks, Zone plates, Microscopes, Extreme ultraviolet lithography, Objectives, Mirrors, Inspection, EUV optics

Proceedings Article | 11 September 2002 Paper
Robert Chow, Robert Bickel, John Ertel, James Pryatel, Gary Loomis, Irving Stowers, John Taylor
Proceedings Volume 4774, (2002) https://doi.org/10.1117/12.481661
KEYWORDS: Contamination, National Ignition Facility, Natural surfaces, Inspection, Optical components, Optical coatings, Light sources, Silica, Reflectivity, Roads

Proceedings Article | 1 July 2002 Paper
Patrick Naulleau, Kenneth Goldberg, Erik Anderson, David Attwood, Phillip Batson, Jeffrey Bokor, Paul Denham, Eric Gullikson, Bruce Harteneck, Brian Hoef, Keith Jackson, Deirdre Olynick, Senajith Rekawa, Farhad Salmassi, Kenneth Blaedel, Henry Chapman, Layton Hale, Regina Soufli, Eberhard Spiller, Donald Sweeney, John Taylor, Christopher Walton, Avijit Ray-Chaudhuri, Donna O'Connell, Richard Stulen, Daniel Tichenor, Charles Gwyn, Pei-yang Yan, Guojing Zhang
Proceedings Volume 4688, (2002) https://doi.org/10.1117/12.472318
KEYWORDS: Printing, Extreme ultraviolet, Lithography, Fiber optic illuminators, Interferometry, Mirrors, Reticles, Modulation transfer functions, Wavefronts, Critical dimension metrology

Showing 5 of 22 publications
Conference Committee Involvement (2)
Optical Manufacturing and Testing VI
31 July 2005 | San Diego, California, United States
Optical Manufacturing and Testing V
3 August 2003 | San Diego, California, United States
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