Jonas Hellgren
at Micronic Laser Systems AB
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 May 2007 Paper
Robert Eklund, Anders Österberg, Jonas Hellgren, Hans Fosshaug, Tord Karlin, Tom Newman
Proceedings Volume 6533, 65330C (2007) https://doi.org/10.1117/12.736923
KEYWORDS: Photomasks, Critical dimension metrology, Spatial light modulators, Convolution, Raster graphics, Neodymium, Electron beam lithography, Data modeling, Deep ultraviolet, Printing

Proceedings Article | 20 May 2006 Paper
Jonas Hellgren, Hans Fosshaug, Anders Österberg, Lars Ivansen
Proceedings Volume 6283, 62831I (2006) https://doi.org/10.1117/12.681743
KEYWORDS: Critical dimension metrology, Photomasks, Convolution, Etching, Spatial light modulators, Data modeling, Raster graphics, Plasma etching, Printing, Deep ultraviolet

Proceedings Article | 28 August 2003 Paper
Proceedings Volume 5130, (2003) https://doi.org/10.1117/12.504276
KEYWORDS: Photomasks, Spatial light modulators, Deep ultraviolet, Mirrors, Image enhancement, Manufacturing, Optical simulations, Solids, Optical proximity correction, Raster graphics

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