Mr. Jonas S. Madsen Profile

Jonas S. Madsen

at DFM A/S

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Author

Publications (4)

Proceedings Article | 17 March 2023 Presentation

Applications of pump modulated UV supercontinuum

Asbjørn Moltke, Jonas Madsen, Callum Smith, Rasmus Engelsholm, Erik Christensen, Mattia Michieletto, Jürgen Appel, Anders Brusch, Christian Petersen, Poul Erik Hansen, Christos Markos, Patrick Montague, Ole Bang

Proceedings Volume PC12405, PC1240507 (2023) https://doi.org/10.1117/12.2649984

KEYWORDS: Ultraviolet radiation, Modulation, Plasma, Lamps, Imaging spectroscopy, Scatterometry, Metrology, Light sources, Transmittance, Supercontinuum sources

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Proceedings Article | 17 March 2023 Presentation

Spectral design of UV supercontinuum using pump modulation

Asbjørn Moltke, Callum Smith, Rasmus Engelsholm, Erik Christensen, Mattia Michieletto, Jonas Madsen, Jürgen Appel, Anders Brusch, Poul Erik Hansen, Christian Petersen, Christos Markos, Patrick Montague, Ole Bang

Proceedings Volume PC12405, PC1240505 (2023) https://doi.org/10.1117/12.2649940

KEYWORDS: Modulation, Ultraviolet radiation, Optical coherence tomography, Deep ultraviolet

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Proceedings Article | 2 March 2020 Paper

Optical metrology for nanowires grown with molecular beam epitaxy

Jonas Skovlund Møller Madsen, Søren Alkærsig Jensen, Thomas Kanne, Jesper Nygård, Poul Erik Hansen

Proceedings Volume 11291, 1129111 (2020) https://doi.org/10.1117/12.2553680

KEYWORDS: Nanowires, Scanning electron microscopy, Scatterometry, Diffraction, Data modeling, Molecular beam epitaxy, Electron beam lithography

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Proceedings Article | 26 June 2017 Paper

Modeling surface imperfections in thin films and nanostructured surfaces

P.-E. Hansen, J. Madsen, S. Jensen, M. Madsen, M. Karamehmedovic

Proceedings Volume 10330, 103300J (2017) https://doi.org/10.1117/12.2270232

KEYWORDS: Modeling, Reflectivity, Silicon, Thin films, Inverse problems, Ellipsometry, Surface roughness, Scattering, Nanostructured thin films, Nanostructuring, Optical metrology, Metrology, Scatterometry

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