Dr. Jonathan D. Kofman
Professor at Univ of Waterloo
SPIE Involvement:
Conference Program Committee | Author
Publications (21)

SPIE Journal Paper | 15 August 2014
Christopher Waddington, Jonathan Kofman
OE, Vol. 53, Issue 08, 084109, (August 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.8.084109
KEYWORDS: Cameras, Signal to noise ratio, Modulation, Fringe analysis, Phase shifts, Projection systems, Calibration, Reflectivity, Imaging systems, Light sources and illumination

Proceedings Article | 17 November 2008 Paper
Chris Yu-Liang Liu, Jonathan Kofman
Proceedings Volume 7266, 72661J (2008) https://doi.org/10.1117/12.817411
KEYWORDS: Calibration, 3D metrology, Sensors, Cameras, Neural networks, 3D image processing, 3D modeling, Projection systems, Artificial neural networks, Laser marking

Proceedings Article | 8 October 2007 Paper
Jonathan Kofman, Jeffrey Wu, Kiatchai Borribanbunpotkat
Proceedings Volume 6718, 67180A (2007) https://doi.org/10.1117/12.754551
KEYWORDS: Calibration, Cameras, 3D metrology, Sensors, Laser marking, 3D image processing, Projection systems, Diffraction, Image sensors, 3D acquisition

SPIE Journal Paper | 1 August 2007
OE, Vol. 46, Issue 08, 083201, (August 2007) https://doi.org/10.1117/12.10.1117/1.2768616
KEYWORDS: Phase shifts, Projection systems, Image processing, 3D metrology, Fringe analysis, 3D modeling, Calibration, 3D image processing, Cameras, Optical engineering

SPIE Journal Paper | 1 April 2007
OE, Vol. 46, Issue 04, 043601, (April 2007) https://doi.org/10.1117/12.10.1117/1.2721025
KEYWORDS: Calibration, Projection systems, 3D modeling, Nonlinear optics, 3D metrology, Cameras, Phase measurement, 3D image processing, Phase shifts, Optical engineering

Showing 5 of 21 publications
Proceedings Volume Editor (7)

SPIE Conference Volume | 17 November 2008

SPIE Conference Volume | 8 October 2007

SPIE Conference Volume | 5 December 2005

Showing 5 of 7 publications
Conference Committee Involvement (16)
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference 2022
18 April 2022 | Yokohama, Japan
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Online, Japan
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Showing 5 of 16 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top