Dr. Jong-Ahn Kim
at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Spectroscopy, Silicon, Fourier transforms, Geometrical optics, Semiconducting wafers, Pulsed laser operation

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Wafer-level optics, Refractive index, Light sources, Femtosecond phenomena, Silicon, Reliability, Semiconductor lasers, Phase measurement, Semiconducting wafers, Pulsed laser operation

Proceedings Article | 13 May 2013 Paper
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Optical microscopes, Imaging systems, Interferometers, Calibration, Digital cameras, Computer programming, CCD cameras, Tablets, Distance measurement, Aluminum

Proceedings Article | 14 May 2012 Paper
Proc. SPIE. 8379, Laser Radar Technology and Applications XVII
KEYWORDS: Light sources, Avalanche photodetectors, LIDAR, Sensors, Photodiodes, Time metrology, Distance measurement, Avalanche photodiodes, Signal detection, Standards development

Proceedings Article | 14 May 2010 Paper
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical components, Microscopes, Monochromatic aberrations, Point spread functions, Sensors, Calibration, Computer simulations, 3D metrology, Cylindrical lenses, Cerium

Showing 5 of 15 publications
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