JongHoon Lim
at SK hynix system ic Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 July 2015 Paper
JongHoon Lim, ByungJu Kim, JaeSik Son, EuiSang Park, SangPyo Kim, DongGyu Yim
Proceedings Volume 9658, 96580Q (2015) https://doi.org/10.1117/12.2193111
KEYWORDS: Photomasks, Photoresist processing, Etching, Inspection, Electroluminescence, Control systems, Chromium, Polymers, Tolerancing, Semiconducting wafers

Proceedings Article | 8 October 2014 Paper
Proceedings Volume 9235, 92351N (2014) https://doi.org/10.1117/12.2066279
KEYWORDS: SRAF, Inspection, Photomasks, Capillaries, Photoresist processing, Particles, Etching, Defect inspection, Bridges, Optical lithography

Proceedings Article | 8 November 2012 Paper
Jong Hoon Lim, Sung Ha Woo, Eui-Sang Park, Sang Pyo Kim, Dong Gyu Yim, Osamu Katada, Tobias Wähler, Peter Dress, Uwe Dietze
Proceedings Volume 8522, 85222L (2012) https://doi.org/10.1117/12.979470
KEYWORDS: Sensors, Mirrors, Photomasks, Photoresist processing, Temperature metrology, Manufacturing, Optimization (mathematics), Photoresist materials, Etching, Critical dimension metrology

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