Dr. Joonmo Ahn
at Institute for Basic Science
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2019 Presentation
Proceedings Volume 10927, 109270D (2019) https://doi.org/10.1117/12.2508439
KEYWORDS: Near field, Near field scanning optical microscopy, Near field optics, Nanostructures, Optical scanning systems, Optical microscopes, Wavefronts, Diffraction

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