Prof. Jörg Bagdahn Profile

Prof. Jörg Bagdahn

at Fraunhofer-Ctr für Silizium-Photovoltaik

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Author

Publications (7)

Proceedings Article | 13 September 2011 Paper

Reduction of soldering induced stresses in solar cells by microstructural optimization of copper-ribbons

R. Meier, M. Pander, R. Klengel, S. Dietrich, S. Klengel, M. Ebert, J. Bagdahn

Proceedings Volume 8112, 811206 (2011) https://doi.org/10.1117/12.893519

KEYWORDS: Annealing, Silicon, Solar cells, Copper, Temperature metrology, Diffusion, Diffraction, Backscatter, Manufacturing, Semiconducting wafers

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Proceedings Article | 13 September 2011 Paper

Investigations on crack development and crack growth in embedded solar cells

M. Sander, S. Dietrich, M. Pander, S. Schweizer, M. Ebert, J. Bagdahn

Proceedings Volume 8112, 811209 (2011) https://doi.org/10.1117/12.893662

KEYWORDS: Solar cells, Glasses, Electroluminescence, Numerical simulations, Silicon, Polymers, Manufacturing, Statistical analysis, Crystalline solar cells, Crystals

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Proceedings Article | 19 August 2010 Paper

Characterization of PV modules by combining results of mechanical and electrical analysis methods

Martin Sander, Bastian Henke, Hannes Schwarz, Sascha Dietrich, Stefan Schweizer, Matthias Ebert, Jörg Bagdahn

Proceedings Volume 7773, 777308 (2010) https://doi.org/10.1117/12.860814

KEYWORDS: Solar cells, Glasses, Electroluminescence, Temperature metrology, Polymers, Thermography, Crystals, Reliability, Manufacturing, Resistance

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Proceedings Article | 19 August 2010 Paper

Thermal cycling induced load on copper-ribbons in crystalline photovoltaic modules

R. Meier, F. Kraemer, S. Wiese, K.-J. Wolter, J. Bagdahn

Proceedings Volume 7773, 777312 (2010) https://doi.org/10.1117/12.861350

KEYWORDS: Glasses, Solar cells, Finite element methods, Temperature metrology, Silicon, Cameras, Crystals, Digital image correlation, Data modeling, 3D modeling

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Proceedings Article | 19 April 2002 Paper

Strength and long-term reliability testing of wafer-bonded MEMS

Matthias Petzold, Dieter Katzer, M. Wiemer, Joerg Bagdahn

Proceedings Volume 4755, (2002) https://doi.org/10.1117/12.462863

KEYWORDS: Semiconducting wafers, Interfaces, Wafer testing, Wafer bonding, Silicon, Reliability, Oxides, Microelectromechanical systems, Mechanics, Control systems

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Proceedings Article | 2 October 2001 Paper

Fracture toughness and fatigue investigations of polycrystalline silicon

Joerg Bagdahn, Jan Schischka, Matthias Petzold, William Sharpe

Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442998

KEYWORDS: Silicon, Ion beams, Actuators, Oxides, Mechanics, Etching, Scanning electron microscopy, Sensors, Reliability, Gallium

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Proceedings Article | 2 October 2001 Paper

Strength assessment of wafer-bonded micromechanical components using the micro-chevron test

Matthias Petzold, Heiko Knoll, Joerg Bagdahn

Proceedings Volume 4558, (2001) https://doi.org/10.1117/12.442994

KEYWORDS: Semiconducting wafers, Reactive ion etching, Oxides, Silicon, Wafer bonding, Microelectromechanical systems, Mechanics, Reliability, Glasses, Electrodes

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Showing 5 of 7 publications

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