Dr. Jorge Piris Profile

Dr. Jorge Piris

Optoelectronics Engineer at European Space Research and Technology Ctr

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Publications (5)

Proceedings Article | 17 November 2017

Evaluation of high power laser diodes for space applications: effects of the gaseous environment and mechanical stress in their long term performance

J. Piris, E. Murphy, M. Levy, G. Klumel, R. Diamant, B. Sarti

Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014

KEYWORDS: Contamination, High power lasers, Nitrogen, Reliability, Oxygen, Semiconductor lasers, Diodes, Astronomical imaging, Space operations, Single crystal X-ray diffraction

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Proceedings Article | 17 November 2017

Long-term vacuum tests of single-mode vertical cavity surface emitting laser diodes used for a scalar magnetometer

C. Hagen, M. Ellmeier, J. Piris, R. Lammegger, I. Jernej, W. Magnes, E. Murphy, A. Pollinger, C. Erd, W. Baumjohann

Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014

KEYWORDS: Polarization, Sensors, Manufacturing, Semiconductor lasers, Diodes, Vertical cavity surface emitting lasers, Astronomical imaging, Laser manufacturing, Magnetometers, Optics manufacturing

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Proceedings Article | 6 December 2016 Paper

Investigation of laser-induced ablation of ceramic materials for spaceborne applications

H. Schroeder, M. Hippler, P. Allenspacher, W. Riede, A. Ciapponi, A. Mateo, T. Ivanov, J. Alves, J. Piris, C. Heese, D. Wernham

Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016

KEYWORDS: Microscopy, Particles, Copper, Ceramics, Inspection, Scanning electron microscopy, Laser ablation, Aluminum, Laser damage threshold, Silicon carbide

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Proceedings Article | 4 November 2014 Paper

Harmonisation of two nanosecond laser-induced damage testing facilities at 1064 nm in vacuum and ambient pressure

C. Heese, A. Ciapponi, J. Piris, T. Ivanov, P. Allenspacher, M. Lammers, H. Schröder, W. Riede

Proc. SPIE. 9237, Laser-Induced Damage in Optical Materials: 2014

KEYWORDS: Aerospace engineering, Laser induced damage, Silicon, Nd:YAG lasers, Optical testing, Data acquisition, Diodes, Damage detection, Laser damage threshold, Semiconducting wafers

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Proceedings Article | 14 November 2013 Paper

Round-Robin experiment on LIDT measurements at 1064 nm in vacuum for space qualification of optics

Stefan Schrameyer, Heinrich Mädebach, Lars Jensen, Detlev Ristau, Clemens Heese, Jorge Piris, Alessandra Ciapponi, Bruno Sarti, Paul Allenspacher, Melanie Lammers, Wolfgang Riede, Andrius Melninkaitis, Gintarė Batavičiūtė, Linas Smalakys, Valdas Sirutkaitis

Proc. SPIE. 8885, Laser-Induced Damage in Optical Materials: 2013

KEYWORDS: Laser sources, Mirrors, Antireflective coatings, Data modeling, Laser induced damage, Error analysis, Coating, Optical testing, Laser damage threshold, Standards development

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