Dr. Jørgen Garnæs Profile

Dr. Jørgen Garnæs

Staff Scientist at Danish Fundamental Metrology Institut

SPIE Involvement:

Author

Proceedings Article | 18 July 2016 Paper

X-ray mirror development and testing for the ATHENA mission

Desiree Della Monica Ferreira, Anders Jakobsen, Sonny Massahi, Finn Christensen, Brian Shortt, Jørgen Garnæs, Antoni Torras-Rosell, Michael Krumrey, Levent Cibik, Stefanie Marggraf

Proceedings Volume 9905, 99055K (2016) https://doi.org/10.1117/12.2232962

KEYWORDS: X-rays, Mirrors, X-ray characterization, X-ray microscopy, Atomic force microscopy, Optical coatings, Multilayers, Surface roughness, Calibration, Data modeling

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Proceedings Article | 19 March 2015 Paper

Smart plastic functionalization by nanoimprint and injection molding

Maksim Zalkovskij, Lasse Thamdrup, Kristian Smistrup, Thomas Andén, Alicia Johansson, Niels Jørgen Mikkelsen, Morten Hannibal Madsen, Jørgen Garnæs, Tommy Tungelund Kristiansen, Mads Diemer, Michael Døssing, Daniel Minzari, Peter Torben Tang, Anders Kristensen, Rafael Taboryski, Søren Essendrop, Theodor Nielsen, Brian Bilenberg

Proceedings Volume 9423, 94230T (2015) https://doi.org/10.1117/12.2085766

KEYWORDS: Nickel, Etching, Diffraction gratings, Coating, Scanning electron microscopy, Nanoimprint lithography, Electron beam lithography, Diffraction, Inspection, Surface finishing

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SPIE Journal Paper | 13 May 2014

Angle-independent structural colors of silicon

Emil Højlund-Nielsen, Johannes Weirich, Jesper Nørregaard, Joergen Garnaes, N. Asger Mortensen, Anders Kristensen

JNP, Vol. 8, Issue 01, 083988, (May 2014) https://doi.org/10.1117/12.10.1117/1.JNP.8.083988

KEYWORDS: Reflectivity, Silicon, Diffraction, Visualization, Refractive index, Diffraction gratings, Photography, Optical properties, Reflection, Absorption

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Proceedings Article | 17 September 2012 Paper

Development and characterization of coatings on silicon pore optics substrates for the ATHENA Mission

Desiree Della Monica Ferreira, Anders Jakobsen, Finn Christensen, Brian Shortt, Michael Krumrey, Jørgen Garnæs, Ronni Simonsen

Proceedings Volume 8443, 84435E (2012) https://doi.org/10.1117/12.927290

KEYWORDS: X-rays, Optical coatings, Silicon, Atomic force microscopy, Data modeling, Surface roughness, Multilayers, Chromium, Transmission electron microscopy, Interfaces

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Proceedings Article | 20 October 2005 Paper

Critical dimension metrology using optical diffraction microscopy

Niels Agersnap, Poul-Erik Hansen, Jan Petersen, Jørgen Garnæs, Nathalie Destouches, Olivier Parriaux

Proceedings Volume 5965, 596508 (2005) https://doi.org/10.1117/12.624769

KEYWORDS: Diffraction, Photoresist materials, Diffraction gratings, Atomic force microscopy, Data modeling, Tantalum, Optical fibers, Optical microscopy, Microscopy, Binary data

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Proceedings Article | 31 August 2005 Paper

Determination of sub-micrometer high aspect ratio grating profiles

J. Garnaes, P.-E. Hansen, N. Agersnap, I. Davi, J. Petersen, A. Kuehle, J. Holm, L. Christensen

Proceedings Volume 5878, 587803 (2005) https://doi.org/10.1117/12.617714

KEYWORDS: Diffraction, Diffraction gratings, Atomic force microscopy, Scanning electron microscopy, Sensors, Data modeling, System on a chip, Americium, Optical microscopy, Microscopy

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Proceedings Article | 4 November 2003 Paper

Comparison of roughness measurement with atomic force microscopy and interference microscopy

Anders Kuhle, Bengt-Goran Rosen, Joergen Garnaes

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.521309

KEYWORDS: Atomic force microscopy, Microscopes, Microscopy, Image filtering, Gaussian filters, Ceramics, Image resolution, Polishing, Surface finishing, Metals

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Showing 5 of 7 publications

Conference Committee Involvement (1)

Recent Developments in Traceable Dimensional Measurements III

31 July 2005 | San Diego, California, United States

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