Dr. Joseph Cohen-Sabban Profile

Dr. Joseph Cohen-Sabban

President at STIL SAS

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Publications (4)

Proceedings Article | 11 August 2008 Paper

Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy

J. Cohen-Sabban, D. Reolon

Proceedings Volume 7064, 706405 (2008) https://doi.org/10.1117/12.797431

KEYWORDS: Interferometry, 3D metrology, Fresnel lenses, Microscopes, Microscopy, Inspection, Sensors, Spectroscopy, Optical interferometry, Visibility

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Proceedings Article | 14 August 2006 Paper

Chromatic confocal phase stepping interferometer

Joseph Cohen-Sabban

Proceedings Volume 6292, 629216 (2006) https://doi.org/10.1117/12.681677

KEYWORDS: Colorimetry, Confocal microscopy, Interferometers, Phase interferometry, Interferometry, Imaging systems, Glasses, Sensors, Light sources, Mirrors

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Proceedings Article | 26 February 2004 Paper

Extended-field confocal imaging for 3D surface sensing

Joseph Cohen-Sabban, Jerome Gaillard-Groleas, Pierre-Jean Crepin

Proceedings Volume 5252, (2004) https://doi.org/10.1117/12.513583

KEYWORDS: Confocal microscopy, Colorimetry, 3D metrology, Imaging systems, Metrology, Stereoscopy, 3D surface sensing, 3D image processing, Associative arrays, Optical testing

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Proceedings Article | 10 December 2001 Paper

Quasi-confocal extended field surface sensing

Joseph Cohen-Sabban, Jerome Gaillard-Groleas, Pierre-Jean Crepin

Proceedings Volume 4449, (2001) https://doi.org/10.1117/12.450093

KEYWORDS: Confocal microscopy, Colorimetry, 3D metrology, Associative arrays, Metrology, Imaging systems, Image segmentation, Optical microscopy, 3D image processing, Optoelectronics

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