Mr. Joseph P. Czarnaski Profile

Joseph P. Czarnaski

at Alaire Technologies Inc

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 6 September 2019 Presentation + Paper

Michael Yetzbacher, Marcos Montes, Marc Christophersen, Jason Edelberg, Joseph Czarnaski, Michael Deprenger, Steve Frawley, Joseph Schlupf

Proceedings Volume 11130, 111300E (2019) https://doi.org/10.1117/12.2531718

KEYWORDS: Fabry–Perot interferometers, Reflectivity, Imaging systems, Spectrometers, Micro optics, Hyperspectral imaging

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Keywords/Phrases