Joseph Huehnerhoff
CTO at SAAM, Inc
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 14 May 2018 Presentation + Paper
Proceedings Volume 10657, 106570N (2018) https://doi.org/10.1117/12.2304374
KEYWORDS: Spectrometers, Raman spectroscopy, Hyperspectral imaging, Imaging systems, Sensors, Image resolution, Collimation, Spectral resolution, Reflectivity, Diffraction gratings

Proceedings Article | 13 February 2018 Paper
Proceedings Volume 10490, 104900T (2018) https://doi.org/10.1117/12.2302731
KEYWORDS: Raman spectroscopy, Spectral resolution, Spectrometers, Sensors, Imaging spectroscopy, Particles, Imaging systems, Photons, Dispersion, Signal to noise ratio

Proceedings Article | 9 June 2017 Paper
Proceedings Volume 10210, 102100E (2017) https://doi.org/10.1117/12.2279886
KEYWORDS: Raman spectroscopy, Spectroscopy, Imaging spectroscopy, Sensors, Spectral resolution, Hyperspectral imaging, Image sensors, Signal to noise ratio, CMOS sensors, Imaging systems

Proceedings Article | 9 August 2016 Paper
Joseph Huehnerhoff, William Ketzeback, Alaina Bradley, Jack Dembicky, Caitlin Doughty, Suzanne Hawley, Courtney Johnson, Mark Klaene, Ed Leon, Russet McMillan, Russell Owen, Conor Sayres, Tyler Sheen, Alysha Shugart
Proceedings Volume 9908, 99085H (2016) https://doi.org/10.1117/12.2234214
KEYWORDS: Telescopes, Imaging systems, Cameras, Observatories, Camera shutters, Sensors, Charge-coupled devices, Quantum efficiency, Glasses, Coating

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