Prof. Joseph A. Turner Profile

Prof. Joseph A. Turner

Associate Professor at Univ of Nebraska-Lincoln

SPIE Involvement:

Author

Proceedings Article | 17 May 2006 Paper

Influence of particle size on the vibration of plates loaded with granular material

Joseph Turner, Wonmo Kang, Florin Bobaru, Liyong Yang, Kitti Rattanadit

Proceedings Volume 6217, 621710 (2006) https://doi.org/10.1117/12.668901

KEYWORDS: Particles, Finite element methods, Land mines, Acoustics, Mining, Interfaces, Inverse problems, Wave plates, Signal analyzers, Mechanics

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Proceedings Article | 11 June 2002 Paper

Scattering of ultrasound in damaged concrete

Liyong Yang, Joseph Turner

Proceedings Volume 4702, (2002) https://doi.org/10.1117/12.469881

KEYWORDS: Scattering, Signal attenuation, Ultrasonography, Lithium, Nondestructive evaluation, Medium wave

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Proceedings Article | 7 June 2002 Paper

Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers

Kangzhi Shen, Joseph Turner

Proceedings Volume 4703, (2002) https://doi.org/10.1117/12.469612

KEYWORDS: Information operations, Complex systems, Statistical modeling, Diamond, Atomic force microscopy, Mechanics, Finite element methods, Atomic force microscope, Motion models, Electro optical modeling

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Proceedings Article | 7 June 2002 Paper

Quantitative elastic-property information with acoustic AFM: measurements and modeling

Donna Hurley, Joshua Wiehn, Joseph Turner, Paul Rice

Proceedings Volume 4703, (2002) https://doi.org/10.1117/12.469632

KEYWORDS: Finite element methods, Niobium, Aluminum, Acoustics, Atomic force microscopy, Silicon, Testing and analysis, Scanning electron microscopy, Glasses, Calibration

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Proceedings Article | 7 June 2002 Paper

Nonlinear vibrations in atomic force microscopy

Joseph Turner

Proceedings Volume 4703, (2002) https://doi.org/10.1117/12.469633

KEYWORDS: Atomic force microscopy, Lithium, Nondestructive evaluation, Reliability, Nanomaterials, Mechanics

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Proceedings Article | 6 August 2001 Paper

Sensitivity of atomic force microscope vibration modes to changes in surface stiffness

Joshua Wiehn, Joseph Turner

Proceedings Volume 4328, (2001) https://doi.org/10.1117/12.435536

KEYWORDS: Atomic force microscopy, Atomic force microscope, Matrices, Mechanics, Feedback control, Analytical research, Smart materials, Material characterization, Statistical modeling, Solids

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