Mr. Joseph M. Wahl Profile

Joseph M. Wahl

Sr Principal Engineer at RTX Corp

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 18 May 2005 Paper

Thomas Mroz, Thomas Hartnett, Joseph Wahl, Lee Goldman, James Kirsch, William Lindberg

Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.607593

KEYWORDS: Spinel, Ceramics, Domes, Sapphire, Mid-IR, Lenses, Missiles, Optical properties, Process control, Thermography

Proceedings Article | 18 May 2005 Paper

Joseph Wahl, Thomas Hartnett, Lee Goldman, Richard Twedt, Charles Warner

Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.607589

KEYWORDS: Ceramics, Domes, Optics manufacturing, Sapphire, Manufacturing, Crystals, Polishing, Transparency, Mid-IR, Aluminum

Proceedings Article | 18 May 2005 Paper

Lee Goldman, Santosh Jha, Nilesh Gunda, Rick Cooke, Neeta Agarwal, Suri Sastri, Alan Harker, Jim Kirsch

Proceedings Volume 5786, (2005) https://doi.org/10.1117/12.607597

KEYWORDS: Optical coatings, Silicon carbide, Silicon, Absorption, Transmittance, Mid-IR, Nitrogen, Resistance, Refraction, Carbon

Proceedings Article | 26 September 2003 Paper

Charles Willingham, Joseph Wahl, Patrick Hogan, Lenn Kupferberg, Thomas Wong, Alok De

Proceedings Volume 5078, (2003) https://doi.org/10.1117/12.500986

KEYWORDS: Particles, Crystals, Transparency, Ceramics, Tablets, Ultrasonics, Temperature metrology, Mid-IR, Domes, Yttrium

Proceedings Article | 7 September 2001 Paper

Lee Goldman, Thomas Hartnett, Joseph Wahl, Robert Ondercin, Karen Olson

Proceedings Volume 4375, (2001) https://doi.org/10.1117/12.439195

KEYWORDS: Ceramics, Sapphire, Aluminum, Geometrical optics, Nitrogen, Crystals, Optical fabrication, Photography, Heat treatments, UV optics

Showing 5 of 6 publications

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Keywords/Phrases