Dr. Juan Antonio Quiroga Profile

Dr. Juan Antonio Quiroga

at Univ Complutense de Madrid

SPIE Involvement:

Author

Publications (23)

Proceedings Article | 22 September 2011 Paper

Optical method for the surface topographic characterization of Fresnel lenses

Juan Carlos Martínez Antón, José Antonio Gómez Pedrero, José Alonso Fernández, Juan Antonio Quiroga

Proceedings Volume 8169, 816910 (2011) https://doi.org/10.1117/12.896952

KEYWORDS: Absorption, Liquids, Fresnel lenses, Light sources, Image resolution, Optical components, Integrating spheres, Cameras, Glasses, Signal detection

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Proceedings Article | 3 August 2010 Paper

Linear systems theory for the analysis of phase-shifting algorithms

Julio Estrada, Manuel Servín, Juan Quiroga

Proceedings Volume 7790, 779008 (2010) https://doi.org/10.1117/12.860982

KEYWORDS: Phase shifts, Interferometry, Filtering (signal processing), Algorithm development, Modulation, Phase shifting, Visualization, Fourier transforms, Algorithms, Demodulation

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Proceedings Article | 3 December 2009 Paper

Directional filters for fringe pattern denoising

Jesús Villa, Juan Antonio Quiroga, Ismael de la Rosa

Proceedings Volume 7499, 74990B (2009) https://doi.org/10.1117/12.849339

KEYWORDS: Fringe analysis, Image filtering, Linear filtering, Denoising, Interference (communication), Digital filtering, Electronic filtering, Image quality, Convolution, Image processing

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Proceedings Article | 3 October 2008 Paper

Robust isoclinic calculation for automatic analysis of photoelastic fringe patterns

J. A. Quiroga, E. Pascual, J. Villa-Hernandez

Proceedings Volume 7155, 715530 (2008) https://doi.org/10.1117/12.814610

KEYWORDS: Photoelasticity, Birefringence, Modulation, Light sources, Phase shifting, Fringe analysis, Phase shifts, Statistical analysis, Phase shift keying, Reliability

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Proceedings Article | 3 October 2008 Paper

Defect inspection by an active 3D multiresolution technique

Javier Vargas, Juan Antonio Quiroga

Proceedings Volume 7155, 71550H (2008) https://doi.org/10.1117/12.814516

KEYWORDS: Cameras, Projection systems, Defect inspection, Imaging systems, Calibration, Phase measurement, 3D metrology, Inspection, 3D modeling, Composites

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SPIE Journal Paper | 1 May 2008

Three-dimensional measurement of microchips using structured light techniques

Javier Vargas, Thomas Koninckx, Juan Antonio Quiroga, Luc Van Gool

OE, Vol. 47, Issue 05, 053602, (May 2008) https://doi.org/10.1117/12.10.1117/1.2919726

KEYWORDS: Cameras, Calibration, 3D metrology, Phase measurement, Projection systems, 3D image processing, Imaging systems, 3D modeling, Picosecond phenomena, Optical engineering

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SPIE Journal Paper | 1 February 2008

Novel multiresolution approach for an adaptive structured light system

Javier Vargas, Juan Antonio Quiroga

OE, Vol. 47, Issue 02, 023601, (February 2008) https://doi.org/10.1117/12.10.1117/1.2857404

KEYWORDS: Cameras, Projection systems, Phase measurement, Calibration, Imaging systems, 3D metrology, Optical engineering, Error analysis, Composites, Structured light

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Proceedings Article | 18 June 2007 Paper

Fourier-based design of asynchronous phase detection algorithms

José Gómez-Pedrero, D. Crespo, Juan Quiroga

Proceedings Volume 6616, 661613 (2007) https://doi.org/10.1117/12.725668

KEYWORDS: Fringe analysis, Phase shift keying, Detection and tracking algorithms, Modulation, Signal analyzers, Demodulation, Signal detection, Error analysis, Optical metrology, Fourier transforms

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Proceedings Article | 18 June 2007 Paper

XtremeFringe: state-of-the-art software for automatic processing of fringe patterns

J. Antonio Quiroga, Daniel Crespo, J. Gomez-Pedrero

Proceedings Volume 6616, 66163Y (2007) https://doi.org/10.1117/12.725670

KEYWORDS: Fringe analysis, Demodulation, Phase shift keying, MATLAB, Filtering (signal processing), Modulation, Fourier transforms, RGB color model, Optical metrology, Spatial frequencies

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SPIE Journal Paper | 1 February 2007

Flexible calibration procedure for fringe projection profilometry

Javier Vargas, Juan Antonio Quiroga, M. Jose Terron-Lopez

OE, Vol. 46, Issue 02, 023601, (February 2007) https://doi.org/10.1117/12.10.1117/1.2709855

KEYWORDS: Calibration, Cameras, Projection systems, Imaging systems, Distortion, 3D metrology, Optical engineering, Model-based design, 3D modeling, Data modeling

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SPIE Journal Paper | 1 October 2006

Adaptive spatiotemporal structured light method for fast three-dimensional measurement

Antonio Quiroga, Daniel Crespo, Javier Vargas, Jose Gomez-Pedrero

OE, Vol. 45, Issue 10, 107203, (October 2006) https://doi.org/10.1117/12.10.1117/1.2361272

KEYWORDS: 3D metrology, Binary data, RGB color model, 3D modeling, 3D image processing, Optical engineering, Projection systems, Cameras, Spatial resolution, Structured light

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Proceedings Article | 14 August 2006 Paper

Single fringe pattern with closed fringes demodulation using row by row scanners

J. Estrada, M. Servín, J. Quiroga, J. Marroquín

Proceedings Volume 6292, 62920B (2006) https://doi.org/10.1117/12.679139

KEYWORDS: Fringe analysis, Demodulation, Modulation, Scanners, Phase shift keying, Interferometry, Moire patterns, Interferometers, Data processing, Phase interferometry

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SPIE Journal Paper | 1 February 2006

New method for three-dimensional shape registration of prismatic objects

Daniel Vazquez, Daniel Crespo, Antonio Quiroga

OE, Vol. 45, Issue 02, 023603, (February 2006) https://doi.org/10.1117/12.10.1117/1.2168417

KEYWORDS: Glasses, 3D scanning, Calibration, 3D metrology, Imaging systems, Distortion, Cameras, Phase measurement, Optical scanning systems, Optical engineering

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Proceedings Article | 14 February 2005 Paper

Asynchronous direct demodulation of spatiotemporal fringe patterns

Juan Antonio Quiroga Mellado, Jose Gomez-Pedrero, Daniel Crespo

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.613768

KEYWORDS: Fringe analysis, Demodulation, Modulation, Phase shift keying, RGB color model, Photoelasticity, Error analysis, Phase shifting, Sensors, Spatial frequencies

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SPIE Journal Paper | 1 February 2005

Laser beam profiling with extended-image-range techniques

R. González-Moreno, Juan Antonio Quiroga, Jose Alonso, Eusebio Bernabeu

OE, Vol. 44, Issue 02, 023602, (February 2005) https://doi.org/10.1117/12.10.1117/1.1840931

KEYWORDS: CCD cameras, Profiling, Digital imaging, Charge-coupled devices, Cameras, Optical engineering, Imaging systems, Single mode fibers, Far-field diffraction, Laser applications

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Proceedings Article | 30 May 2003 Paper

Isotropic n-dimensional quadrature transform and its applications in fringe pattern processing

J. Quiroga, Manuel Servin, Jose Marroquin, Jose Gomez-Pedrero

Proceedings Volume 5144, (2003) https://doi.org/10.1117/12.499801

KEYWORDS: Fringe analysis, Modulation, Demodulation, Phase shift keying, Fourier transforms, Spatial frequencies, Image processing, Detection and tracking algorithms, Linear filtering, Signal processing

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Proceedings Article | 29 May 2002 Paper

Real discontinuity preservation algorithm for ESPI fracture measuring

Ramon Rodriguez-Vera, J. Rayas, Jose Marroquin Zaleta, Mariano Rivera, J. Quiroga

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468840

KEYWORDS: Speckle interferometry, Phase shift keying, Image processing, Fringe analysis, Speckle, Modulation, Phase measurement, Optical filters, Optical metrology, Structural engineering

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SPIE Journal Paper | 1 December 2001

Wave front measurement by solving the irradiance transport equation for multifocal systems

J. Quiroga, Jose Gomez-Pedrero, Juan Martinez-Anton

OE, Vol. 40, Issue 12, (December 2001) https://doi.org/10.1117/12.10.1117/1.1418715

KEYWORDS: Wavefronts, Wave propagation, Spatial frequencies, Signal to noise ratio, Light wave propagation, Interferometry, Deflectometry, Fourier transforms, Point spread functions, Optical engineering

Proceedings Article | 23 October 2001 Paper

Detection of microbumps in aeronautic surfaces by means of an elastical moire system

Juan Martinez-Anton, Hector Canabal, J. Quiroga, Eusebio Bernabeu, M. Alvaro-Labajo, V. Testillano

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445559

KEYWORDS: Visualization, Defect detection, Inspection, Optical inspection, Ronchi rulings, Composites, CCD cameras, Diffraction gratings, Prototyping, Moire patterns

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Proceedings Article | 13 August 1999 Paper

Automatic techniques for evaluation of moire deflectograms

J. Quiroga, J. Villa, Daniel Crespo

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357730

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Proceedings Article | 13 August 1999 Paper

Application of regularization methods to the analysis of photoelastic fringe patterns

J. Quiroga, A. Gonzalez-Cano

Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357729

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SPIE Journal Paper | 1 June 1999

Fourier transform method for automatic processing of moire deflectograms

J. Quiroga, Daniel Crespo, Eusebio Bernabeu

OE, Vol. 38, Issue 06, (June 1999) https://doi.org/10.1117/12.10.1117/1.602138

KEYWORDS: Fourier transforms, Fringe analysis, Ronchi rulings, Phase shifts, Phase measurement, Optical engineering, Deflectometry, Modulation, Collimation, Image filtering

Proceedings Article | 1 December 1991 Paper

Ophthalmic lenses testing by moire deflectometry

T. Yonte, J. Quiroga, Javier Alda, Eusebio Bernabeu

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57492

KEYWORDS: Lenses, Monochromatic aberrations, Deflectometry, Moire patterns, Holographic interferometry, Mechanics, Fringe analysis, Nondestructive evaluation, Mirrors, Spherical lenses

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Showing 5 of 23 publications

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