Julian Uebel
at Rheinland-Pfälzische Technische Univ Kaiserslautern-Landau
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 August 2023 Presentation + Paper
T. Groche, J. Seewig, V. Follmann, J. Uebel
Proceedings Volume 12618, 126180U (2023) https://doi.org/10.1117/12.2673175
KEYWORDS: Light scattering, Sensors, Associative arrays, Scattered light, Surface roughness, Optical testing, Measurement devices, Fourier transforms, Diodes, Computer simulations

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