Dr. Jung-Jin Kim
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 November 2024 Presentation + Paper
Proceedings Volume 13216, 132161Y (2024) https://doi.org/10.1117/12.3034358
KEYWORDS: Critical dimension metrology, Laser development, Extreme ultraviolet, Photomasks, Deep ultraviolet, Quality management, Quality control, Wet etching, Transmittance, Reflection

Proceedings Article | 20 May 2016 Paper
Jung-Jin Kim, Junyoul Choi, Soowan Koh, Minho Kim, Jiyoung Lee, Han-Shin Lee, Byung Gook Kim, Chan-uk Jeon
Proceedings Volume 9984, 99840W (2016) https://doi.org/10.1117/12.2246678
KEYWORDS: Air contamination, Photomasks, Molybdenum, Ions, Transmission electron microscopy, Silicon, Critical dimension metrology, Wet etching, Scanners, Pellicles

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