Dr. Jung-Yeol Yeom
Senoir Research Engineer at Korea Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 November 2008 Paper
Jung-Yeol Yeom, Young-Jun Roh, Chang-Ook Jung, Dae-Hwa Jeong
Proceedings Volume 7266, 72660Q (2008) https://doi.org/10.1117/12.807340
KEYWORDS: X-rays, Sensors, Microchannel plates, X-ray imaging, Inspection, Spatial resolution, Image sensors, Defect detection, Particles, Microscopes

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