Dr. Jungjae Park
at Korea Research Institute of Standards and Science
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Glasses, Refractive index, Error analysis, Interferometers, Motion measurement, Light sources, Optical interferometry, Motion analysis, Inspection, Mathematical modeling

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Refractive index, Silicon, Semiconducting wafers, Microfluidics, Interferometers, Optical interferometry, Profilometers, Optical testing

Proceedings Article | 28 May 2014 Paper
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Semiconducting wafers, Silicon, Wafer-level optics, Interferometers, Semiconductors, Packaging, Geometrical optics, Metrology, Light sources, Spectroscopy

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Semiconducting wafers, Silicon, Refractive index, Wafer-level optics, Geometrical optics, Fourier transforms, Light sources, Pulsed laser operation, Spectroscopy, Femtosecond phenomena

Proceedings Article | 5 June 2013 Paper
Proc. SPIE. 8706, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV
KEYWORDS: Refractive index, Semiconducting wafers, Silicon, Pulsed laser operation, Femtosecond phenomena, Wafer-level optics, Phase measurement, Reliability, Semiconductor lasers, Light sources

Showing 5 of 8 publications
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