Prof. Jürgen W. Czarske
Professor of Measurement Systems Engineering at TU Dresden
SPIE Involvement:
Conference Program Committee | Author | Editor | Student Chapter Advisor
Area of Expertise:
Optoelectronic computational metrology , Precision measurements under harsh environments , Biophotonics and optogenetics , Wavefront shaping , Adaptive microscopy , Brillouin microscopy with stimulated scattering
Profile Summary

Jürgen Czarske is Professor of the Faculty of Electrical and Computer Engineering at TU Dresden, Germany.

Prof. Czarske studied Physics and Electrical Engineering, received the Ph.D. degrees (with highest honors) in Electrical and Mechanical Engineering in 1995 and the venia legendi in 2003, all from Gottfried Wilhelm Leibniz University of Hannover, Germany. After working for 9 years at LZH e.V. (private Laser Center) Prof. Czarske joined TU Dresden in 2004. He is director of the institute for systems engineering and member of excellence cluster physics of life.

His technical activities and interest include:
- Laser metrology based on holography, interferometry and spectroscopy
- Computational optics, digital holography, Brillouin sensing, adaptive microscopy, digital optical phase conjugation, and adaptive optics for flow research

His service to technical community includes:
- Review Board on Measurement Systems at the colleague of Systems Engineering of German Research Foundation
- Member of the Editorial Board of several journals and Program Committee of several conferences

Honors and awards include:
2019: Joseph Fraunhofer Award and Robert M. Burley Prize of OSA
2018: Best Paper Awards, 2nd and 3rd, OSA, Imaging and Applied Optics Congress, Orlando
2018: Member of Saxon Academy of Science
2016: Fellow EOS
2015: Fellow SPIE
2015: Fellow OSA
2015: Outstanding Paper Award: Precision Measurement, Meas. Sci. Technol.
2014: Reinhart Koselleck Project, Bonn
2013: Selected paper of Journal of Physics D
2013: Excellent paper, awarded at the 33th annual meeting of the Japan Laser Society, Tokyo
2011: ASME Best Paper Award on Controls, Diagnostics and Instrumentation, Vancouver
2009: Best Paper Award of the international OPTO conference
2008: International Berthold Leibinger Innovation award, Ditzingen
2001: Highly commended article of Measurement Science and Technology, Bristol
1996: Measurement technique prize, Munich
Publications (67)

Proceedings Article | 22 April 2020 Presentation
Proc. SPIE. 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation VIX
KEYWORDS: Sensors, Calibration, Glasses, Composites, Vibrometry, Fiber reinforced polymers, Structural design, Failure analysis, Performance modeling, Diffraction gratings

Proceedings Article | 22 April 2020 Presentation + Paper
Proc. SPIE. 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation VIX
KEYWORDS: Numerical simulations, Digital image correlation, Motion measurement, 3D image capture

Proceedings Article | 1 April 2020 Presentation
Proc. SPIE. 11359, Biomedical Spectroscopy, Microscopy, and Imaging

Proceedings Article | 1 April 2020 Presentation
Proc. SPIE. 11359, Biomedical Spectroscopy, Microscopy, and Imaging
KEYWORDS: Calibration, Stereoscopy, Microscopy, Organisms, Image resolution, Endoscopes, Phased arrays, In vivo imaging, Tissue optics, Phased array optics

Proceedings Article | 1 April 2020 Presentation
Proc. SPIE. 11359, Biomedical Spectroscopy, Microscopy, and Imaging
KEYWORDS: Holography, Atrial fibrillation, Visualization, Calcium, Heart, Optogenetics, Action potentials, Electrophysiology, Tissue optics, Mouse models

Showing 5 of 67 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (20)
Optical Measurement Systems for Industrial Inspection XII
21 June 2021 | Munich, Germany
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Chiba, Japan
Optical Elastography and Tissue Biomechanics VIII
6 March 2021 | San Francisco, California, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Unconventional Optical Imaging II
7 April 2020 | Online Only, France
Showing 5 of 20 Conference Committees
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