Justin M. Foley
Physicist at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 March 2013 Paper
Proceedings Volume 8633, 863310 (2013) https://doi.org/10.1117/12.2014532
KEYWORDS: Long wavelength infrared, Reflectivity, Polarization, Silicon, Reflectors, Etching, FT-IR spectroscopy, Optical filters, Fabry–Perot interferometers, Spectroscopy

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