Justin L. Kreuzer
Principal Researcher at Justin Kreuzer Consulting LLC
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 June 2003 Paper
Proceedings Volume 5040, (2003) https://doi.org/10.1117/12.485328
KEYWORDS: Polarization, Lithographic illumination, Printing, Extreme ultraviolet, Photomasks, Nanoimprint lithography, Image quality, Immersion lithography, Diffraction, Lithography

Proceedings Article | 5 July 2000 Paper
Daniel Cote, David Ahouse, Daniel Galburt, Hilary Harrold, Justin Kreuzer, Mike Nelson, Mark Oskotsky, Geoffrey O'Connor, Harry Sewell, David Williamson, John Zimmerman, Richard Zimmerman
Proceedings Volume 4000, (2000) https://doi.org/10.1117/12.389043
KEYWORDS: Lithography, Semiconducting wafers, 193nm lithography, Reticles, Distortion, Combined lens-mirror systems, Binary data, Calcium, Critical dimension metrology, Mirrors

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