Ms. Karrie D. Houston Profile

Karrie D. Houston

at NASA Goddard Space Flight Ctr

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Proceedings Article | 7 September 2006 Paper

Comparative mirror cleaning study: a study on removing particulate contamination

Karrie Houston

Proceedings Volume 6291, 629107 (2006) https://doi.org/10.1117/12.683231

KEYWORDS: Particles, Semiconducting wafers, Contamination, Silicon, Picture Archiving and Communication System, Wafer-level optics, Mirrors, Gold, Carbon monoxide, Reflectivity

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A mirror cleaning study was conducted to assess the effectiveness of three cleaning methods in their ability to remove particulate contamination from reflective mirror surfaces. Presently, the detergent bath, solvent rinse, and CO₂ snow cleaning methods are the most commonly used optical cleaning techniques within the optics industry. These techniques are also commonly used by the Optics Branch/Code 551 at Goddard Space Flight Center (GSFC) to remove particulate contamination from optical surfaces. In this experimental study, the above-mentioned cleaning methods were used to clean twelve uncoated silicon wafers, twelve gold coated silicon wafers, and twelve gold coated silicon wafers with a silicon oxide protective coating. CO₂ snow cleaning had an average removal percentage of 84%, followed by the solvent rinse at 74%, and the detergent bath at 61%. In addition to the average removal percentage, this comparative study was designed to: (1) determine the cleaning ability of each method based on the number and size of removed particles; (2) assess the risk of surface damage for each cleaning procedure; (3) evaluate each cleaning method as a function of its initial "qualitative" contamination level ("fairly clean", "dirty", and "very dirty"). The particulate cleanliness of all wafers was characterized using Image Analysis and Image-Pro Plus 5.0 software. In addition, the experimental design and experimental results were analyzed using JMP/Statistical Analytical Software Version 6.0.

Proceedings Article | 7 September 2006 Paper

Contamination control of space-based laser instruments

Philip Chen, Randy Hedgeland, Larry Ramsey, Rachel Rivera, Karrie Houston

Proceedings Volume 6291, 629104 (2006) https://doi.org/10.1117/12.681175

KEYWORDS: Contamination, Contamination control, Laser applications, Laser induced damage, Space based lasers, LIDAR, Space operations, Pulsed laser operation, Laser development, Semiconductor lasers

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Space based laser missions have gained their popularity in areas such as: communication, power beaming, ranging, altimetry, and Light Detection and Ranging. The capabilities of 1.0 micron lasers offer a host of improvements in the knowledge gaps that exist and help promote our understanding of our Earth and lunar environments as well as planetary and space science applications. Some past and present National Aeronautics and Space Administration missions that have been developed for increasing our universal knowledge of such environments and applications include: The Shuttle Laser Altimeter, Mars Orbiter Laser Altimeter, Geoscience Laser Altimeter System, Mercury Laser Altimeter, Cloud-Aerosol Lidar and Infrared Pathfinder Satellite Observation, and Lunar Orbiter Laser Altimeter. The effort of contamination control depends on the specific performance goals, instrument designs, and planned operating scenarios of such missions. Trace amounts of contamination have been shown to greatly reduce the performance of 1.0 micron space based laser systems. In addition, the type of contamination plays an important role in the degree of degradation and helps to define the "contamination sensitivity" of the mission. A space based laser mission is considered highly contamination sensitive and therefore requires an unprecedented contamination control effort.

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