Prof. Karsten Buse
Executive Director at Fraunhofer-IPM
SPIE Involvement:
Author
Publications (37)

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11266, Laser Resonators, Microresonators, and Beam Control XXII
KEYWORDS: Photodetectors, Prisms, Lithium niobate, Microresonators, Second-harmonic generation, Optical parametric oscillators, Resonators, Crystals, Frequency combs, Phase velocity

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11266, Laser Resonators, Microresonators, and Beam Control XXII
KEYWORDS: Light sources, Microresonators, Resonators, Laser resonators

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11266, Laser Resonators, Microresonators, and Beam Control XXII
KEYWORDS: Near infrared, Second-harmonic generation, Optical parametric oscillators, Resonators, Ultraviolet radiation, Frequency combs, Nonlinear optics, Harmonic generation, Frequency conversion

Proceedings Article | 2 March 2020 Paper
Proc. SPIE. 11266, Laser Resonators, Microresonators, and Beam Control XXII
KEYWORDS: Refractive index, Prisms, Lithium niobate, Microresonators, Resonators, Polarization, Electrodes, Laser resonators, Electro optics, Frequency conversion

Proceedings Article | 4 March 2019 Paper
Proc. SPIE. 10902, Nonlinear Frequency Generation and Conversion: Materials and Devices XVIII
KEYWORDS: Refractive index, Lithium niobate, Optical parametric oscillators, Lithium, Resonators, Spectroscopy, Crystals, Wavelength tuning, Phase matching, Light wave propagation

Showing 5 of 37 publications
Conference Committee Involvement (5)
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Optical Measurement Systems for Industrial Inspection VIII
13 May 2013 | Munich, Germany
SPIE Optical Metrology 2013
13 May 2013 | Munich, Germany
Optical Micro- and Nanometrology
16 April 2012 | Brussels, Belgium
Optical Measurement Systems for Industrial Inspection
23 May 2011 | Munich, Germany
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