Prof. Kazuto Yamauchi
Professor at Osaka Univ
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (53)

Proceedings Article | 13 December 2020 Presentation
Proc. SPIE. 11444, Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray
KEYWORDS: Point spread functions, Mirrors, Sun, Spectroscopy, Particles, X-rays, Magnetism, Coronagraphy, X-ray imaging, Solar processes

Proceedings Article | 22 August 2020 Poster + Paper
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, Sensors, Electrodes, Wavefront sensors, Wavefronts, Adaptive optics, Deformable mirrors, Zoom lenses, Prototyping

Proceedings Article | 22 August 2020 Presentation
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, X-ray optics, Interferometers, X-rays, Complex systems, Nonlinear optics, Spatial coherence, X-ray lasers, Tolerancing, Free electron lasers

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Mirrors, X-ray optics, X-rays, Control systems, Zoom lenses, Beam shaping, X-ray lasers, Synchrotron radiation, Free electron lasers, Beam controllers

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11491, Advances in X-Ray/EUV Optics and Components XV
KEYWORDS: Actuators, Photovoltaics, Mirrors, Ferroelectric materials, Nanoparticles, X-rays, Silver, Deformable mirrors, Hard x-rays, Lead

Showing 5 of 53 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 11 January 2017

SPIE Conference Volume | 14 October 2014

SPIE Conference Volume | 26 September 2012

SPIE Conference Volume | 23 August 2010

Conference Committee Involvement (37)
X-Ray Nanoimaging: Instruments and Methods V
1 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XVI
1 August 2021 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Optical Manufacturing and Testing XIII
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Showing 5 of 37 Conference Committees
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