Dr. Kee-Keun Lee
Professor at Ajou University
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 7 March 2014 Paper
Proc. SPIE. 8975, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
KEYWORDS: Resonators, Reflectivity, Reflectors, Antennas, Gyroscopes, Sensors, Metals, Wave propagation, Acoustics, Gold

Proceedings Article | 9 March 2013 Paper
Proc. SPIE. 8614, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
KEYWORDS: Solar cells, Quartz, Chromium, Glasses, Photovoltaics, Microlens array, Packaging, Microlens, Etching, CCD cameras

Proceedings Article | 15 February 2012 Paper
Proc. SPIE. 8250, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
KEYWORDS: Polymers, Photorefractive polymers, Quartz, Microlens, Etching, Microlens array, Chromium, Fabrication, Refraction, Scanning electron microscopy

Proceedings Article | 28 February 2011 Paper
Proc. SPIE. 7928, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
KEYWORDS: Quartz, Etching, Spherical lenses, Polymers, Coating, Microlens array, Chromium, Refractive index, Photorefractive polymers, Microlens

Proceedings Article | 28 February 2011 Paper
Proc. SPIE. 7928, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
KEYWORDS: Wave propagation interference, Signal generators, Gyroscopes, Semiconducting wafers, Wave propagation, Network security, Sensors, Acoustics, Biosensors, Velocity measurements

Showing 5 of 14 publications
Conference Committee Involvement (5)
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
3 February 2014 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
4 February 2013 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
23 January 2012 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X
24 January 2011 | San Francisco, California, United States
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices IX
25 January 2010 | San Francisco, California, United States
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