Keisuke Goto
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 28 April 2020 Open Access
JEI, Vol. 29, Issue 04, 041013, (April 2020) https://doi.org/10.1117/12.10.1117/1.JEI.29.4.041013
KEYWORDS: Inspection, X-rays, X-ray imaging, X-ray computed tomography, Feature extraction, Statistical modeling, Binary data, Neural networks, Error analysis, Defect detection

Proceedings Article | 16 July 2019 Paper
Proceedings Volume 11172, 111720T (2019) https://doi.org/10.1117/12.2521762
KEYWORDS: Statistical analysis, Computer programming, Inspection, X-rays, X-ray computed tomography, Feature extraction, Defect detection, X-ray imaging, Error analysis, Neural networks

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