Dr. Kenneth W. Tobin
Director / Corporate Research Fellow at Oak Ridge National Lab
SPIE Involvement:
Author
Area of Expertise:
Computer vision , Instrumentation , Pattern recognition , Metrology , Radiography , Image processing
Websites:
Profile Summary

Dr. Tobin is the Director of the Measurement Science and Systems Engineering (MSSE) Division at the Oak Ridge National Laboratory (ORNL), Oak Ridge, Tennessee, USA, where he has been working in various R&D capacities since 1987. He has extensive experience in R&D, R&D leadership, management, and strategic organization and planning. The MSSE Division is composed of 160 research, technical, and administrative staff who perform R&D in measurement science associated with electronics, sensors, signals, communications, and integrated systems. As Director, he is responsible for the strategic direction of the organization and for supporting the mission areas of the U.S. Department of Energy and ORNL.

Dr. Tobin was named an ORNL Corporate Research Fellow in 2003 for his contributions to the field of applied computer vision research that addressed industrial and economic competitiveness, biomedical measurement science, and national security. He has authored and co-authored over 135 publications and he currently holds ten U.S. Patents with three additional patents pending in areas of computer vision, photonics, radiography, and microscopy. Dr. Tobin is a Fellow of the International Society for Optics and Photonics (SPIE) where he is currently an Associate Editor for the Journal of Electronic Imaging. He is also a Senior Member of the Institute of Electrical and Electronics Engineers. He was the recipient of the R&D 100 Award by R&D Magazine in 2002 and again in 2010 for his work in content-based image retrieval applied to both industry and biomedicine. He was the Tennessee Academy of Science Industrial Scientist of the Year in 2000 for his Leadership and Scientific Contributions to Semiconductor Metrology.
Publications (52)

Proceedings Article | 7 February 2011 Paper
Proc. SPIE. 7877, Image Processing: Machine Vision Applications IV
KEYWORDS: Imaging systems, Sensors, Scintillators, Radiography, Image resolution, Optical simulations, Charge-coupled devices, Modulation transfer functions, Coded apertures, Coded aperture imaging

Proceedings Article | 13 March 2010 Paper
Proc. SPIE. 7623, Medical Imaging 2010: Image Processing
KEYWORDS: Eye, Radon, Detection and tracking algorithms, Cameras, Sensors, Image segmentation, Capillaries, Image processing, Retina, Radon transform

Proceedings Article | 3 April 2008 Paper
Proc. SPIE. 6913, Medical Imaging 2008: Physics of Medical Imaging
KEYWORDS: Veins, Tissues, Scattering, Blood, Skin, 3D modeling, Monte Carlo methods, Photon transport, 3D image processing, Absorption

Proceedings Article | 29 May 2007 Paper
Proc. SPIE. 6356, Eighth International Conference on Quality Control by Artificial Vision
KEYWORDS: Microelectromechanical systems, Semiconductors, Holograms, Metrology, Inspection, Interferometry, Wavefronts, Photomasks, Phase measurement, Semiconducting wafers

Proceedings Article | 21 March 2007 Paper
Proc. SPIE. 6509, Medical Imaging 2007: Visualization and Image-Guided Procedures
KEYWORDS: Near infrared, Light emitting diodes, Principal component analysis, Veins, Imaging systems, Cameras, Calibration, Skin, Reflectivity, 3D modeling

Showing 5 of 52 publications
Proceedings Volume Editor (9)

SPIE Conference Volume | 10 March 2006

SPIE Conference Volume | 17 May 2005

SPIE Conference Volume | 29 April 2004

Showing 5 of 9 publications
Conference Committee Involvement (24)
Wavelet Applications in Industrial Processing VII
18 January 2010 | San Jose, California, United States
Image Processing: Machine Vision Applications II
22 January 2009 | San Jose, California, United States
Wavelet Applications in Industrial Processing VI
21 January 2009 | San Jose, California, United States
Image Processing: Machine Vision Applications
29 January 2008 | San Jose, California, United States
Wavelet Applications in Industrial Processing V
11 September 2007 | Boston, MA, United States
Showing 5 of 24 Conference Committees
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