An improved and optimized spectral spot-scanning system for visible focal plane array (FPA) sub-micron pixel photoresponse
testing is presented. This updated configuration includes: (1) additional diagnostic analysis tools which more
completely characterize the operation of the system; (2) a confocal microscope fitted into the optical system to aid in
more precise determination of spot focusing on the imager; (3) a post-acquisition transformation to imager pixel
response data to reduce overall data acquisition time. Wavelength-dependent pixel response data is presented to
demonstrate the repeatability of this setup as well as to quantify the impact of random and systematic experimental
errors.
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