Dr. Kevin A. Grossklaus Profile

Dr. Kevin A. Grossklaus

at Tufts Univ

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Author

Publications (4)

Proceedings Article | 13 March 2024 Presentation

Iridium processing of metasurfaces for infrared optical applications

Zachary Kranefeld, T. Pan Menasuta, John McElearney, Victor Vazquez, Kevin Grossklaus, Thomas Vandervelde

Proceedings Volume PC12888, PC128880N (2024) https://doi.org/10.1117/12.3001949

KEYWORDS: Iridium, Infrared radiation, Reactive ion etching, Optics manufacturing, Scanning electron microscopy, Vacuum chambers, Thin films, Thin film deposition, Sputter deposition, Spectroscopic ellipsometry

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Proceedings Article | 8 March 2024 Poster + Paper

Determination of optical constants of n- and p-type GaAs as a function of carrier concentration

Charles Dickerson, John McElearney, Kevin Grossklaus, Thomas Vandervelde

Proceedings Volume 12882, 128820R (2024) https://doi.org/10.1117/12.2692580

KEYWORDS: Gallium arsenide, Refractive index, Doping, Optical properties, Light absorption, Absorption, Reflection, Data modeling, Spectroscopic ellipsometry, Optoelectronics

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Proceedings Article | 7 May 2019 Paper

Subwavelength antimonide infrared detector coupled with dielectric resonator antenna

Alireza Kazemi, Qingyuan Shu, Vinita Dahiya, Zahra Taghipour, Pablo Paradis, Christopher Ball, Theodore Ronningen, Stefan Zollner, Steven Young, Jordan Budhu, Kevin Grossklaus, Thomas Vandervelde, Anthony Grbic, Sanjay Krishna

Proceedings Volume 11002, 1100221 (2019) https://doi.org/10.1117/12.2518807

KEYWORDS: Sensors, Antennas, Long wavelength infrared, Absorption, Dielectrics, Resonators, Infrared sensors, Chemical elements, Signal to noise ratio, Etching

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Proceedings Article | 1 March 2019 Paper

Optical property comparison of GaAsBi and TlGaAs measured by variable angle spectroscopic ellipsometry

Samuel Lenney, Kevin Grossklaus, Margaret Stevens, Thomas Vandervelde

Proceedings Volume 10917, 109172A (2019) https://doi.org/10.1117/12.2510550

KEYWORDS: Bismuth, Thallium, Optical properties, Absorption, Gallium arsenide, Temperature metrology, Spectroscopic ellipsometry, Data modeling, Semiconductors, Statistical modeling

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