Kevin W. Lyons
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 21 August 2009 Paper
Proceedings Volume 7405, 740503 (2009) https://doi.org/10.1117/12.828307
KEYWORDS: Manufacturing, Nanotechnology, Standards development, Metrology, Nanolithography, Nanomaterials, Carbon nanotubes, Defense and security, Nanostructures, System integration

Proceedings Article | 9 September 2008 Paper
Proceedings Volume 7042, 704202 (2008) https://doi.org/10.1117/12.798004
KEYWORDS: Metrology, Manufacturing, Standards development, Nanoparticles, Nanotechnology, Nanomaterials, Process control, Nanocomposites, Control systems, 3D metrology

Proceedings Article | 12 September 2007 Paper
Proceedings Volume 6648, 66480D (2007) https://doi.org/10.1117/12.735615
KEYWORDS: Manufacturing, Information technology, Standards development, Information fusion, Metrology, Control systems, Data modeling, Systems modeling, Imaging systems, Nanolithography

Proceedings Article | 10 September 2007 Paper
Proceedings Volume 6648, 664802 (2007) https://doi.org/10.1117/12.730855
KEYWORDS: Metrology, Nanotechnology, Manufacturing, Standards development, Semiconductors, Safety, Nanomaterials, Nanostructures, Principal component analysis, Bridges

Proceedings Article | 9 April 2007 Paper
Proceedings Volume 6576, 65760L (2007) https://doi.org/10.1117/12.725206
KEYWORDS: Manufacturing, Standards development, Nanotechnology, Metrology, Nanolithography, Nanostructures, 3D modeling, Control systems, Modeling and simulation, 3D metrology

Conference Committee Involvement (11)
Independent Component Analyses, Compressive Sampling, Large Data Analyses (LDA), Neural Networks, Biosystems, and Nanoengineering XIII
23 April 2015 | Baltimore, MD, United States
Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XII
7 May 2014 | Baltimore, MD, United States
Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XI
1 May 2013 | Baltimore, Maryland, United States
Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX
27 April 2011 | Orlando, Florida, United States
Instrumentation, Metrology, and Standards for Nanomanufacturing IV
2 August 2010 | San Diego, California, United States
Showing 5 of 11 Conference Committees
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