Prof. Khaled J. Habib
S.Research Scientist/Full Research Professor at Kuwait Institute for Scientific Research
SPIE Involvement:
Conference Program Committee | Author
Area of Expertise:
Techniques of optical interferometry , Holographic interferometry , Shearography , Science & Technology of new instruments of electrochemistry , NDT methods of materials evaluation in corrosive media , Metallic Corrosion
Profile Summary

Dr. Khaled Habib holds a Ph.D in Chem. and Mats. Engr. from the Optical Science and Technological Center of University of Iowa, Iowa, USA, 1988. He was a Post-doctoral Fellow at the Chem. Engr. Dept., and Mat. sci. Dept., of the Technical University of Aachen, Aachen, Germany, 1991-1992. He specializes in “Quantum Electrochemistry” and more specifically “Opto-electrochemical instruments” in which solely light (as a quantum tool) can be used not only for submicroscopic imaging of surface/interface phenomena of solids in electrolytes, but also, it can be used in situ to measure electrochemical parameters corresponding to the surface/interface phenomena of the solids. Also, Materials Science, Metallic corrosion, and Characterization of nanometer structures of metallic glasses are of interest. Mr. Habib has in his credit more than 126 articles in international refereed journals in his area of specialization. He is a fellow of the SPIE ( Also, he is a member of the international Corrosion Council (ICC), ( In addition, he is a Member of the editorial board of five Journals; the journal of Corrosion Science and Technology(, the Journal of Environmental Science and Engineering A&B (,the American Journal of Applied Chemistry(, the journal of Science Research(, the journal of Advances in Petroleum Exploration and Development(
He has been a reviewer for a number of journals; Optics and Lasers in Engineering, Applied Optics, Optical Engineering, Optics and Lasers Technology, the Optical Expression, IEEE Transaction Instruments and Measurements, the ASTM journal of Testing and Evaluation,
Publications (47)

Proceedings Article | 5 May 2012 Paper
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Gold, Carbon, Thin films, Polishing, Ultraviolet radiation, Optical coatings, Shearography, Dielectric spectroscopy, Thin film coatings, Temperature metrology

Proceedings Article | 14 September 2011 Paper
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Carbon, Cameras, Electrodes, Resistance, Optical coatings, Time metrology, Shearography, Dielectric spectroscopy, Natural surfaces, Temperature metrology

Proceedings Article | 27 May 2011 Paper
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Mathematical modeling, Oxides, Carbon, Iron, Resistance, Corrosion, Optical interferometry, Holographic interferometry, Electromagnetism, Temperature metrology

Proceedings Article | 11 May 2011 Paper
Proc. SPIE. 8074, Holography: Advances and Modern Trends II
KEYWORDS: Mathematical modeling, Oxides, Carbon, Iron, Resistance, Corrosion, Interferometry, Optical interferometry, Holographic interferometry, Electromagnetism

Proceedings Article | 3 August 2010 Paper
Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis
KEYWORDS: Mathematical modeling, Oxides, Carbon, Iron, Resistance, Corrosion, Optical interferometry, Holographic interferometry, Electromagnetism, Temperature metrology

Showing 5 of 47 publications
Conference Committee Involvement (83)
Applied Optical Metrology III
1 August 2021 | San Diego, California, United States
The 4th International Conference on Materials Engineering and Nanotechnology, ICMEN 2021,General Conference Co-Chairman
3 April 2021 |
The Fifth International Conference on Energy Engineering and Environmental Protection (EEEP2020) , a member of the technical program committee
17 November 2020 |
Sixth International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2020), A member ofInternational Program Committee
23 September 2020 |
The 2020 3rd International Conference on Energy and Power Engineering (EPE2020), A member of Technical Program Committee
20 September 2020 |
Showing 5 of 83 Conference Committees
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