Kieran P. Harney
Operations Manager at Analog Devices Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 January 2005 Open Access Paper
Proceedings Volume 5716, (2005) https://doi.org/10.1117/12.597110
KEYWORDS: Microelectromechanical systems, Reliability, Packaging, Sensors, Semiconducting wafers, Standards development, Silicon, Semiconductors, Signal processing, Analog electronics

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top