We present a novel method for determining a spectral phase derivative from a single spectral interferogram obtained by using a white-light interferometry technique, which is further used for calculation of chromatic dispersion profile. The method is based on direct calculations of a second derivative of the registered spectral intensity at extremal points. We explain theoretical background of the method, discuss its limitations and evaluate an accuracy by numerical simulations. Additionally, we validate the proposed method in dispersion measurements of the BK7 glass plate and the SMF-28 fiber.
We present an alignment procedure which allows for precise gluing of a structure with an optically pumped quantum emitter to the end face of zirconia ferrule with a specially fabricated high numerical aperture single-mode fiber. The proposed method is an important step towards building a single-photon source based on an InGaAs quantum dot emitting in 1.3 μm range and located deterministically in a microlens fabricated by in-situ electron beam lithography and plasma etching to improve the photon extraction efficiency. Since single QDs are very dim at room temperature which hinders QD-fiber adjustment by maximizing the collected photoluminescence signal, the developed method uses light back-reflected from the top surface of the sample with microlens as a feedback signal. Using this approach, we were able to position the high-NA fiber over the center of the microlens with an accuracy of about 150 nm in a lateral direction and 50 nm in a vertical direction. The alignment accuracy was confirmed by following the room temperature emission from quantum wells embedded in a reference microlens. We also present initial low temperature tests of the coupling system mounted in a compact and portable Stirling cryocooler.