Dr. Kiril Simov
Process Engineer at Intel Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 September 2014 Paper
Proceedings Volume 9174, 91740O (2014) https://doi.org/10.1117/12.2062487
KEYWORDS: Manganese, Germanium, Magnetism, Doping, Silicon, Scanning tunneling microscopy, Crystals, Chemical species, Diffusion, Annealing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top