Using statistical interferometry technique (SIT), a highly sensitive interferometry technique developed in our laboratory, we reported about the existence of nanometric intrinsic fluctuations (NIF) in a variety of plants. SIT permits noncontact, noninvasive, and fast detection of plant growth fluctuations in subnanometer scale. We propose the application of NIF to investigate the effect of heavy metal, cadmium, on growth dynamics of Chinese chive (Allium tuberosum). NIFs of leaves were observed for 3 days under four different concentrations of CdCl2: 0, 0.001, 0.01, and 0.1 mM. Results showed significant reduction of NIFs within 4 h for all Cd concentrations, and there was a further decrease with the exposure time of Cd under 0.1 and 0.01 mM. In addition, under 0.001 mM, a significant recovery could be observed after a rapid reduction in the first 4 h. As a comparison, measured antioxidative enzymes increased with increasing Cd concentration. However, no significant increase could be seen within the initial 4 h under a smaller concentration of 0.001 mM as seen for NIFs. The results imply that NIF can be used as an indicator for heavy metal stress on plants as well as it can be more sensitive to detect the influence of smaller Cd amounts on plants at an early stage.
Cadmium(Cd) is an environmental contaminant heavy metal having high toxicity. The aim of this study is to investigate the effect of Cd on growth dynamics of plants in the order of sub-nanometers, using a novel optical interference technique, named as Statistical Interferometry Technique(SIT). In this study, a special attention is paid to the short-term growth fluctuation in measurements of the in-plane displacement of the leaf. In the experiments, Chinese chives(Allium Tuberosum) were used as samples, and the growth and its nanometric growth fluctuations were measured for Cd exposure. This nanometric fluctuation that was found in our previous study, is an intrinsic property of the plant and is referred to as nanometric intrinsic fluctuations(NIF). The effect of Cd on plant growth fluctuation, i.e., NIF of growth rate was observed for three days continuously by exposing their roots to four CdCl2 concentrations 0, 0.001, 0.01, and 0.1mM. The standard deviation(SD) of NIF of healthy leaf was 4.0nm/mm sec, and it reduced to 3.1nm/mm sec and 1.8nm/mm sec after 6 hours and 54 hours after exposing to 0.1mM Cd, respectively. For smaller concentration of 0.01mM, less reduction in SD of NIF was confirmed compared to those for 0.1mM. In addition, under 0.001mM, a significant recovery could be observed after a rapid reduction in the first 6 hours. The results imply that NIF can be a measure for heavy metal stress and is sensitive enough to detect the influence of smaller amount of Cd(from 0.001mM to 0.1mM) on plants in a very early stage.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.