Kristýna Holanová
at Institute of Photonics and Electronics CAS
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 April 2019 Paper
Proceedings Volume 11028, 110282P (2019) https://doi.org/10.1117/12.2522360
KEYWORDS: Optical microscopy, Scattering, Microscopes, Interferometry, Light scattering, Microscopy, Nanoparticles, Reflection, Signal detection

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