Kun Yu
at Institute of Automation
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2004 Paper
Kun Yu, Yunhong Wang, Tieniu Tan
Proceedings Volume 5404, (2004) https://doi.org/10.1117/12.541917
KEYWORDS: Feature extraction, Tablets, Polonium, Feature selection, Reliability, Computing systems, Biometrics, Statistical methods, Error analysis, Statistical analysis

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