Kun Zhang
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 May 2019 Paper
Proc. SPIE. 11068, Second Symposium on Novel Technology of X-Ray Imaging
KEYWORDS: Optical components, Silica, Ions, Surface roughness, Ion beams, Defense technologies, Ion beam finishing, Surface finishing, Plasma, Absorption

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