Kuninori Nishizawa
at Nihon Synopsys GK
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 November 2024 Presentation + Paper
Kokoro Kato, Satoshi Mitsuno, Kuninori Nishizawa, Ken Kuo, Johnny Yeap, J. Jou
Proceedings Volume 13216, 132161L (2024) https://doi.org/10.1117/12.3034562
KEYWORDS: Computed tomography, Optical proximity correction, Semiconductor manufacturing, Mathematical optimization, Manufacturing, Data processing, Standards development, Semiconductors, Semiconducting wafers, Photomasks

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