Kyoung Chan Kim
at KAIST
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 17 May 2001 Paper
Proc. SPIE. 4285, Testing, Reliability, and Applications of Optoelectronic Devices
KEYWORDS: Diffraction, Light sources, Speckle, Sensors, Laser induced damage, Time metrology, Signal processing, Prototyping, Resolution enhancement technologies, Diffraction gratings

Proceedings Article | 17 May 2001 Paper
Proc. SPIE. 4285, Testing, Reliability, and Applications of Optoelectronic Devices
KEYWORDS: Signal to noise ratio, Light sources, Speckle, Sensors, Image sensors, Signal processing, Optical resolution, Charge-coupled devices, CCD image sensors, Light

Proceedings Article | 29 March 2000 Paper
Proc. SPIE. 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
KEYWORDS: Light sources, Light emitting diodes, Detection and tracking algorithms, Speckle, Sensors, Laser induced damage, Interference (communication), Detector arrays, Signal processing, Light

Proceedings Article | 29 March 2000 Paper
Proc. SPIE. 3945, Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
KEYWORDS: Actuators, Diffraction, Magnesium, Sensors, Control systems, Kinematics, Semiconductor lasers, Vibrometry, Sensing systems, Diffraction gratings

Proceedings Article | 7 May 1999 Paper
Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
KEYWORDS: Optical design, Moire patterns, Sensors, Calibration, Error analysis, Manufacturing, Computer programming, Multimedia, Signal detection, Phase shifts

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