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Kyungjun Choi
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Publications (2)
Proceedings Article | 15 March 2012 Open Access Paper
Yield enhancement with DFM
Seung Weon Paek, Jae Hyun Kang, Naya Ha, Byung-Moo Kim, Dae-Hyun Jang, Junsu Jeon, DaeWook Kim, Kun Young Chung, Sung-eun Yu, Joo Hyun Park, SangMin Bae, DongSup Song, WooYoung Noh, YoungDuck Kim, HyunSeok Song, HungBok Choi, Kee Sup Kim, Kyu-Myung Choi, Woonhyuk Choi, JoongWon Jeon, JinWoo Lee, Ki-Su Kim, SeongHo Park, No-Young Chung, KangDuck Lee, YoungKi Hong, BongSeok Kim
Proceedings Volume 8327, 832704 (2012) https://doi.org/10.1117/12.920029
KEYWORDS: Design for manufacturing, Silicon, Polishing, Optical proximity correction, Back end of line, Metals, Failure analysis, Yield improvement, Logic, Manufacturing
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Proceedings Article | 13 March 2009 Paper
Enhanced layout optimization of sub-45nm standard: memory cells and its effects
Seung Weon Paek, Dae Hyun Jang, Joo Hyun Park, Naya Ha, Byung-Moo Kim, Hyo Sig Won, Kyu-Myung Choi, Kuang-Kuo Lin, Simon Klaver, Shobhit Malik, Michiel Oostindie, Frank Driessen
Proceedings Volume 7275, 72751M (2009) https://doi.org/10.1117/12.815413
KEYWORDS: Design for manufacturing, Semiconducting wafers, Yield improvement, Manufacturing, Laser induced breakdown spectroscopy, Standards development, Tolerancing, Optimization (mathematics), Optical proximity correction, Silicon
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