Kyungjun Choi
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 15 March 2012 Paper
Proc. SPIE. 8327, Design for Manufacturability through Design-Process Integration VI
KEYWORDS: Polishing, Logic, Metals, Silicon, Manufacturing, Design for manufacturing, Optical proximity correction, Failure analysis, Yield improvement, Back end of line

Proceedings Article | 13 March 2009 Paper
Proc. SPIE. 7275, Design for Manufacturability through Design-Process Integration III
KEYWORDS: Silicon, Manufacturing, Laser induced breakdown spectroscopy, Design for manufacturing, Optical proximity correction, Optimization (mathematics), Semiconducting wafers, Tolerancing, Yield improvement, Standards development

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